Capabilities

For over 20 years, Phoebus has performed advanced optoelectronic device innovation and development in collaboration with government and defense companies. Our capabilities include:

Technology Innovation: We work with partners to brainstorm path-breaking approaches to technology innovation that addresses the sensor markets, defense markets, renewable energy.
Device Modeling and Simulation: With Optus, CST MWS, Synopsys FullWave, and other programs, we perform complete device design and simulation under realistic conditions.
Device Fabrication: We perform advanced micro and nanofabrication of complex photonic structures. This includes thin film depositions of all necessary materials, photo and electron lithography, etching, and microscopy.
Device Characterization: Full optical, infrared characterization of devices at low, room, and high temperature. SEM, TEM, Auger, ellipsometry, and other microscopy is performed.

Technology Innovation

Phoebus engineers work closely with government program managers and our company partners to understand their technology needs, put together project teams and plans, and perform the projects. Phoebus excels at device innovation, design and simulation, and prototype development and technology demonstration.

Device Design and Modeling

Complex electromagnetic, photonic, and optical structures are designed and simulated by Phoebus engineers.

Device Fabrication

After 20 years of continuous photonics innovation, Phoebus has the capabilities to fabricate the most challenging of nano-photonic structures. Capabilities include:

Thin film deposition: standard CMOS and nonstandard materials for infrared devices
Lithography: photolithography, electron-beam lithography, holographic lithography, and imprint lithography
Etching: Dry and wet chemical etching, including high-aspect ratio features
Metrology: SEM, TEM, Auger, ellipsometry

Device Characterization

Phoebus has a full suite of optical and infrared characterization tools, including:

FTIR with external, customizable beam profiles.
Optical to far IR characterization with Horiba spectrometers/monochrometers
Tunable IR lasers and other light sources